Pricing

BeamShift aims to be transparent when it comes to pricing. Additional fees may apply to listed prices based on the complexity of the work. As a courtesy, your first sample submission for any of our services is on us.

FIB

• FIB device cross sectioning starting at $300 per sample

SEM

• Surface imaging starting at $150 per sample

• Cleaved section imaging starting at $250 per sample

30kV STEM

• STEM imaging starting at $650 per sample (includes FIB sample preparation)

200kV S/TEM

• S/TEM imaging starting at $800 per sample (includes FIB sample preparation)

Contact Us

For any inquiries, please reach
out to us at:

support@beamshiftmetrology.com

We typically respond in less than
24 hours.