TEM/STEM

Transmission Electron Microscopy has experienced growing adoption in the semiconductor industry due to its sub nanometer imaging resolution capabilities. Combined with FIB, it is now possible to prepare ultra high resolution cross sections of site specific features. We offer both 200kV and 30kV STEM imaging.

200kV S/TEM

  • High resolution imaging in S/TEM at 0.3 nm resolution

  • High Resolution EDS elemental mapping

  • Bright Field and Dark Field imaging

30kV STEM

  • Bright Field and Dark Field imaging at 0.6 nm resolution

  • EDS elemental mapping

  • Most economical STEM option available